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KOS.FS - fakultní nadstavba
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Experimental Methods of Study Material (E321504)
Katedra:ústav materiálového inženýrství (12132)
Zkratka:EMSMSchválen:01.10.2014
Platí do: ??Rozsah:2+2
Semestr:LKredity:6
Zakončení:Z,ZKJazyk výuky:EN
Anotace
Methods of diffraction: X-ray and electron diffraction (for the phase analysis to determine the residual stress, texture, and for analysis of lattice defects). Display methods: light and electron microscopy (preparation of sample and display characteristics, preparation of contrast theory). Advanced Methods of physical and chemical microanalysis: scanning electron microscopy (emission, transmission and conductivity method). Electron probe microanalysis: wavelength and energy dispersive X-ray spectroscopy, quantitative microanalysis, signal processing.
Osnova
1. Light microscopy (sample preparation and display characteristics, contrast theory)
2. Confocal microscopy, light spectroscopy methods analysis (GDOES, etc.)
3. The electrons, interact with the sample I, transmission electron microscopy (principle, sample preparation)
4. Transmission electron microscopy (display characteristics, contrast theory)
5. Special methods of TEM (HV TEM, HR TEM)
6. Scanning electron microscopy (principle, sample preparation)
7. Scanning electron microscopy (display characteristics, contrast theory)
8. Electron diffraction (phase analysis, residual stress, texture, lattice defects)
9. The interaction of electrons with the sample, x-ray spectroscopy, the analysis of the chemical composition, EDS and WDS, XRS
10. Methods SPM
11. Quantitative X-ray microanalysis
12. Electron and ion spectroscopy
13. Electron and ion spectroscopy and microanalysis
Osnova cvičení
Literatura
Požadavky
Klíčová slova
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